Royo, C.; Apari... - Usefulness of spectral reflect...

Basic information

Author	Royo, C.; Aparicio, N.; Villegas, D.; Casadesus, J.; Monneveux, P.; Araus, J. L.
Title	Usefulness of spectral reflectance indices as durum wheat yield predictors under contrasting Mediterranean conditions
Journal	International Journal of Remote Sensing
DOI	10.1080/0143116031000150059
Link	http://dx.doi.org/10.1080/0143116031000150059
Date/Year	2003/01/01 / 2003
Location
Publisher
Volume	24
Issue	22
Pages	4403-4419
Keywords
Comment

Nr.	Name	General Formula
1	Normalized Difference 415/435	$\frac{415nm - 435nm}{415nm + 435nm}$
2	Normalized Difference 531/570	$\frac{531nm - 570nm}{531nm + 570nm}$
3	Normalized Difference 680/430	$\frac{680nm - 430nm}{680nm + 430nm}$
4	Normalized Difference 900/680	$\frac{900nm - 680nm}{900nm + 680nm}$
5	Simple Ratio 970/900	$\frac{970nm}{900nm}$
6	Simple Ratio NIR/RED	$\frac{NIR}{RED}$
7	Single Band 550	$550nm$
8	Single Band 680	$680nm$
9	Structure Intensive Pigment Index 1	$\frac{800nm - 445nm}{800nm - 680nm}$

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